TWP - Multi channel Thermal Wireless Profiler
TWP
Multi channel, Thermal wireless profiler for semiconductor processes setup
MXR High power Microscope
MXR Semiconductor inspection microscope
High power - cost effective microscope for wafer inspection
TCWafers
Thermocouple instrumented Wafers
Thermocouple instrumented wafers for any kind of process control need, from low to extremely high temperatures, from 4 to 12"
PC Profiling Software
PC Software for thermal profiling
A powerful and easy to use software for PC for a complete thermal profiling on TC Wafers to interface Thermal Wireless Profilers
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