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Bluetooth wireless profiler for thermocouple instrumented wafers

 The TWP thermal wireless profiler is a flexible tool to measure temperatures during silicon wafer production processes.

It is based on a thermocouple conditioning unit, available in 8 or 16 channels version, which is connected to a data display and recording unit implemented on a handheld computer via a Bluetooth wireless transmission.

The instrument can be used with thermocouple equipped wafers and is capable of different data display options such as tables, maps and single channel.

 System is also capable of data logging, with a powerful and easy to use system for data storage. 

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