We are proud to announce that we have introduced new products into our portfolio.

We developed a new, extremely powerful map driven microscope inspection system for wafers, called SemiMAP. It is a system  which can be used together with many semiconductor inspection microscopes to build up wafer review stations with mapa management capabilities.

To complete our range of inspection products we also inrtroduced our new MX-R inspection microscope, a relly cost effective solution for wafer inspection.

 Also with this new effort, Semicon Synapsis helps you in the long path between sand to silicon.........